
Centre for Advanced Materials Research
Centre de recherche sur les matériaux avancés
JEOL TEM
Capabilities of JEOL JEM-2100F field emission TEM
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Characterize Size, morphology and crystalline structure of materials with a lattice resolution of 0.1nm.
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Analyze elemental compositions (from B to U) of materials at nano-meter scales.
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Determine elemental distribution and heterogeneity of nano-particles.

JEOL SEM
Capabilities of JEOL JSM-7500F field emission SEM
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Surface topography with high resolution (in-lens detector) and excellent depth of field.
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High resolution compositional images with backscatter electron detector
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Quantitative elemental analysis and elemental mapping with the Oxford Instruments EDS system.
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High contrast, high resolution, low voltage STEM imaging for low contrast specimens.

FEI TEM
Capabilities of FEI Tecnai G2 spirit Twin TEM
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High resolution and high contrast imaging for biological and soft materials (20-120kV).
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Cryo-electron microscopy for vitrified frozen hydrate samples.
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3-D electron tomography.
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Imaging the same area with Integrated Florescent Microscopy and Electron Microscopy (Icorr)

Service Request Equipment
Managed by Anabel Lanterna
Service Request Equipment
Managed by Neeraj Joshi
Surface Area and Porosity
Capabilities of Micromeritics 3Flex
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Automated 3-stage instrument provides superior micro/mesopore analysis and adsorption measurements
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Ideally suited for the characterization of a wide variety of porous and non-porous materials
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Vapour sorption capability
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Isotherm data collections starting at range of 10 µtorr

LC-MS
Our new Agilent InfinityLab Liquid Chromatography/Mass Selective Detector (LC/MSD) system uses the power of mass selective detection to enhance analytical confidence. The single quadrupole LC/MSD system is running in parallel to the Infinity II LC system.

ICP-OES
Our new Agilent ICP-OES allows us detection of more than 70 elements, including alkaline and transition metals.

Service Request Equipment
Managed by Yun Liu
Centre for Advanced Materials Research
Centre de recherche sur les matériaux avancés
