Capabilities of JEOL JEM-2100F field emission TEM

  • Characterize Size, morphology and crystalline structure of materials with a lattice resolution of 0.1nm. 

  • Analyze elemental compositions (from B to U) of materials at nano-meter scales.

  • Determine elemental distribution and heterogeneity of nano-particles.


Capabilities of JEOL JSM-7500F field emission SEM

  • Surface topography with high resolution (in-lens detector) and excellent depth of field. 

  • High resolution compositional images with backscatter electron detector

  • Quantitative elemental analysis and elemental mapping with the Oxford Instruments EDS system.

  •  High contrast, high resolution, low voltage STEM imaging for low contrast specimens.


Capabilities of FEI Tecnai G2 spirit Twin TEM

  • High resolution and high contrast imaging for biological and soft materials (20-120kV).

  • Cryo-electron microscopy for vitrified frozen hydrate samples.

  • 3-D electron tomography.

  • Imaging the same area with Integrated Florescent Microscopy and Electron Microscopy (Icorr)


Service provided by Queen's University

Service Request Equipment

Managed by Anabel Lanterna

Service Request Equipment

Managed by Neeraj Joshi

Surface Area and Porosity

Capabilities of Micromeritics 3Flex

  • Automated 3-stage instrument provides superior micro/mesopore analysis and adsorption measurements

  • Ideally suited for the characterization of a wide variety of porous and non-porous materials

  • Vapour sorption capability

  • Isotherm data collections starting at range of 10 µtorr 


Our new Agilent InfinityLab Liquid Chromatography/Mass Selective Detector (LC/MSD) system uses the power of mass selective detection to enhance analytical confidence. The single quadrupole LC/MSD system is running in parallel to the Infinity II LC system.


Our new Agilent ICP-OES allows us detection of more than 70 elements, including alkaline and transition metals.

Service Request Equipment

Managed by Yun Liu

Centre for Advanced Materials Research

Centre de recherche sur les matériaux avancés

© CAMaR last updated Dec 2020 by Neeraj Joshi