JEOL TEM

Capabilities of JEOL JEM-2100F field emission TEM

• Characterize Size, morphology and crystalline structure of materials with a lattice resolution of 0.1nm. 

• Analyze elemental compositions (from B to U) of materials at nano-meter scales.

• Determine elemental distribution and heterogeneity of nano-particles.

JEOL SEM

Capabilities of JEOL JSM-7500F field emission SEM

• Surface topography with high resolution (in-lens detector) and excellent depth of field. 

• High resolution compositional images with backscatter electron detector

• Quantitative elemental analysis and elemental mapping with the Oxford Instruments EDS system.

•  High contrast, high resolution, low voltage STEM imaging for low contrast specimens.

FEI TEM

Capabilities of FEI Tecnai G2 spirit Twin TEM

• High resolution and high contrast imaging for biological and soft materials (20-120kV).

• Cryo-electron microscopy for vitrified frozen hydrate samples.

• 3-D electron tomography.

• Imaging the same area with Integrated Florescent Microscopy and Electron Microscopy (Icorr)

XPS

Service provided by Queen's University

Surface Area and Porosity

Capabilities of Micromeritics 3Flex

• Automated 3-stage instrument provides superior micro/mesopore analysis and adsorption measurements

• Ideally suited for the characterization of a wide variety of porous and non-porous materials

• Vapour sorption capability

• Isotherm data collections starting at range of 10 µtorr